Electron microscope
ZEISS EVO LS 15 scanning electron microscope
ZEISS EVO LS 15 scanning electron microscope – a microscope providing a topographical image of the natural or artificial surface of a sample, elemental analysis of the sample (EDS analysis), with the possibility of observing hydrated samples/cell cultures in their native state (environmental mode) or indicative evaluation of ultrathin sections in transmission (STEM detector).
Samples suitable for the microscope EVO LS 15
NOTES: The instrument Leica EM CPD 300, Leica EM UC7 and SEM components - Beam deceleration, cooling stage and dry scroll vacuum pump were purchased with the support of Faculty grant PROMEGA No 032/22
Although the ZEISS EVO LS 15 microscope has the possibility of STEM imaging when observing samples in transmission, it neither reaches the resolution of a TEM, nor a FESEM, it is primarily intended for the SEM modality.